Semiconductor Inspection Microscopes

Automatic Semiconductor MX61A
Automatic Semiconductor
MX61A
To provide optimum solutions which are flexible automation and highly extensibility. Selectable controllers, Inspection and Analysis can fulfill your needs in the 300mm Automatic Semiconductor Inspection Microscope System.
 
300mm Wafer / FPD Inspection Microscope MX61L
300mm Wafer / FPD Inspection Microscope
MX61L
Advanced basic optical performance and diverse observation modes reaching the highest efficiency in observation and inspection
- 300mm wafer/FPD inspection microscope
 
Semiconductor Inspection Microscope MX61
Semiconductor Inspection Microscope
MX61
Advanced basic optical performance and diverse observation modes reaching the highest efficiency in observation and inspection
- 200mm wafer inspection microscope
 
Industrial inspection microscope MX51
Industrial inspection microscope
MX51
The MX51 microscope is an industrial inspection microscope with improved basic optical performance, increased expandability, and the capability of handling a wide variety of specimens such as metals, various types of raw materials and 150mm semiconductor wafers.