Product Features

Imaging Slopes Up to 85 Degrees

Thanks to dedicated objective lenses with high numerical apertures and a dedicated optical system that obtains maximum performance from the 405 nm laser, the LEXT OLS4000 can reliably measure acute-angled specimens that were previously impossible to measure.

Razor with an Acute Angle

LEXT-dedicated Objective Lenses

Overcoming Reflectance Differences

The LEXT OLS4000 employs a newly developed dual confocal system. Thanks to the integration of two confocal optical systems, the LEXT OLS4000 can capture a clear image from a specimen consisting of materials with different reflectance characteristics.

Specimen with Diverse Reflectance
(Diamond-electrodeposited Tool)

Dual Confocal system

Minimize influence from Measurement Environments

Hybrid Vibration-damping Mechanism

To eliminate external influences on measurement and from measurement environment, the LEXT OLS4000 incorporates a hybrid vibration-damping mechanism using coil springs and damping rubber. This eliminates the need for a dedicated vibration-damping stand, allowing measurements on any desktop.

Reduced Vibration Influence
with the Vibration
Isolation Mechanism

Influence Derived
from External Vibrations

World's First Double Performance Guarantees

The performance of a measuring tool or its accuracy is expressed in two different terms. One is "Accuracy", which indicates how close a measurement value is to the true value, and the other is "Repeatability", which indicates the degree of variations among repeated measurement values. The LEXT OLS4000 assures both accuracy and repeatability - a world's first for laser microscopes.

Two Performance Guarantees

The LEXT OLS4000 uses a rigorous system of production for every component from the objective lens to the laser head, Olympus delivers only the highest quality systems to customers after thorough inspection based on stringent standards. Final adjustment and calibration is performed at delivery by qualified engineers in the actual measurement environment.

Reproducing More Realistic Images of Micro Asperities

Differential Interference Contrast (DIC) is an observation method for visualizing sub-nanometer micro asperities,which are far beyond the resolving power of a laser microscope. This DIC allows you to obtain live images comparable to those of an electron microscope under relatively low power magnifications.

Laser Confocal with DIC (Polymer Film)

Laser Confocal (Polymer Film)