Confocal Laser Scanning Microscopes / Deep UV
3D Measuring Laser Microscope
LEXT OLS4000
This model is capable of observation/measurement of mini-region surface profile at high resolution by using the 405nm laser.
Deep Ultraviolet Light Observation
System for Microscopes
U-UVF248
The DUV imaging band 248+/-4nm is completely corrected to prevent residual chromatic aberration. The use of specialized optical materials and efficient design allow for brightest images available at this performance enhancing wavelength with some customer reporting result of 0.08um.
Achieve this high resolution, simply by adding a new module to a new or existing Olympus Microscope you can make high-magnification DUV light real-time observation
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| DUV observation | Visible-light observation |